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Ways of on-line test for digital IC

  • L. Yuying*
  • , H. Yunhua
  • , C. Hongbing
  • , C. Jinyan
  • *此作品的通讯作者
  • Ordnance Engineering College

科研成果: 会议稿件论文同行评审

摘要

Characteristic and application range of vector and some non-vector on-line test technique are analyzed in this paper. Then on-line test technique based on dynamic signal comparison is proposed. It is realized by VXIbus instrument. The technique avoids using neilsbed. It tests rapidly and uses conveniently.

源语言英语
676-678
页数3
出版状态已出版 - 2001
已对外发布
活动4th International Symposium on Test and Measurement (ISTM/2001) - Shanghai, 中国
期限: 1 6月 20013 6月 2001

会议

会议4th International Symposium on Test and Measurement (ISTM/2001)
国家/地区中国
Shanghai
时期1/06/013/06/01

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