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Wafer-size VO2 film prepared by water-vapor oxidant

  • Hui Ren
  • , Bowen Li
  • , Xiaoyu Zhou
  • , Shi Chen
  • , Yamin Li
  • , Changlong Hu
  • , Jie Tian
  • , Guobin Zhang
  • , Yang Pan
  • , Chongwen Zou*
  • *此作品的通讯作者
  • University of Science and Technology of China
  • The University of Osaka

科研成果: 期刊稿件文章同行评审

摘要

The growth of wafer-scale and uniform monoclinic VO2 film with excellent phase transition property was a challenge if considering the multivalent nature of vanadium atom and the various phase structures of VO2 compound. Direct oxidation of metallic vanadium film by annealing in oxygen gas or in air was suggested to be an easy way for VO2 film preparation, while the oxidation parameters including the gas pressure, gas flux and annealing temperature were extremely sensitive due to the critical preparation window. Here we proposed a facile water-vapor assisted thermal oxidation to produce wafer-scale VO2 films with good uniformity. Results indicated that by using the water vapor as the oxidizing agent, the temperature window for VO2 growth was greatly broadened. In addition, the obtained wafer-size VO2 film showed very uniform surface and sharp resistance change, which was attributed to the improved crystallinity and the high oxygen stoichiometry. The chemical reaction route was calculated based on Gibbs free energy, which confirmed the preferred growth of VO2 film by wet oxidation. Our results not only demonstrated that the water vapor could be used as a modest oxidizing agent, but also showed the unique advantage for large size VO2 film preparation, which was useful for practical devices applications in the future.

源语言英语
文章编号146642
期刊Applied Surface Science
525
DOI
出版状态已出版 - 30 9月 2020
已对外发布

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