TY - GEN
T1 - Van der Waals infrared photoncharacterization detectors for standard blackbody
AU - Wang, Yang
AU - Hu, Weida
AU - Zhou, Peng
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - We will discuss the standard blackbody characterization and time response characterization techniques for infrared photon detectors. These standardized techniques provide a reliable and consistent way to evaluate the performance of infrared photon detectors and are essential for ensuring the accuracy and repeatability of device measurements. Overall, this perspective will provide valuable insights into the latest innovations in the field, and how these innovations are advancing the capabilities and reliability of these devices.
AB - We will discuss the standard blackbody characterization and time response characterization techniques for infrared photon detectors. These standardized techniques provide a reliable and consistent way to evaluate the performance of infrared photon detectors and are essential for ensuring the accuracy and repeatability of device measurements. Overall, this perspective will provide valuable insights into the latest innovations in the field, and how these innovations are advancing the capabilities and reliability of these devices.
KW - Van der Waals
KW - infrared photon detectors
KW - standard blackbody characterization
UR - https://www.scopus.com/pages/publications/105010834877
U2 - 10.1109/EDTM61175.2025.11041102
DO - 10.1109/EDTM61175.2025.11041102
M3 - 会议稿件
AN - SCOPUS:105010834877
T3 - 9th IEEE Electron Devices Technology and Manufacturing Conference: Shaping the Future with Innovations in Devices and Manufacturing, EDTM 2025
BT - 9th IEEE Electron Devices Technology and Manufacturing Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 9th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2025
Y2 - 9 March 2025 through 12 March 2025
ER -