TY - JOUR
T1 - Validation of overlapping clustering
T2 - A random clustering perspective
AU - Wu, Junjie
AU - Yuan, Hua
AU - Xiong, Hui
AU - Chen, Guoqing
PY - 2010/11/15
Y1 - 2010/11/15
N2 - As a widely used clustering validation measure, the F-measure has received increased attention in the field of information retrieval. In this paper, we reveal that the F-measure can lead to biased views as to results of overlapped clusters when it is used for validating the data with different cluster numbers (incremental effect) or different prior probabilities of relevant documents (prior-probability effect). We propose a new "IMplication Intensity" (IMI) measure which is based on the F-measure and is developed from a random clustering perspective. In addition, we carefully investigate the properties of IMI. Finally, experimental results on real-world data sets show that IMI significantly alleviates biased incremental and prior-probability effects which are inherent to the F-measure.
AB - As a widely used clustering validation measure, the F-measure has received increased attention in the field of information retrieval. In this paper, we reveal that the F-measure can lead to biased views as to results of overlapped clusters when it is used for validating the data with different cluster numbers (incremental effect) or different prior probabilities of relevant documents (prior-probability effect). We propose a new "IMplication Intensity" (IMI) measure which is based on the F-measure and is developed from a random clustering perspective. In addition, we carefully investigate the properties of IMI. Finally, experimental results on real-world data sets show that IMI significantly alleviates biased incremental and prior-probability effects which are inherent to the F-measure.
KW - Cluster validation
KW - F-measure
KW - Implication intensity (IMI)
KW - Incomplete beta function
KW - Information retrieval
UR - https://www.scopus.com/pages/publications/77956370931
U2 - 10.1016/j.ins.2010.07.028
DO - 10.1016/j.ins.2010.07.028
M3 - 文章
AN - SCOPUS:77956370931
SN - 0020-0255
VL - 180
SP - 4353
EP - 4369
JO - Information Sciences
JF - Information Sciences
IS - 22
ER -