TY - GEN
T1 - Using failure analysis techniques to identify key information of PHM
AU - Jiang, Maogong
AU - Fu, Guicui
AU - Wang, Danyan
AU - Zhang, Dong
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2016/1/12
Y1 - 2016/1/12
N2 - Failure analysis (FA) is a basic and effective method to obtain the physical and failure information of electronic components and circuits. Most of these information can provide many useful evidences for prognostic and system health management (PHM) of electronic products. To obtain these information, many failure analysis techniques are used. This paper focuses on analyzing the relationship between FA techniques and PHM system. To test and verify the availability of the relationship between FA techniques and PHM system, a failure analysis case of an Intelligent Power Module (IPM) is used to study the relationship. This IPM contains six insulated gate bipolar transistors (IGBTs) and there are obvious burnout indications on most of them after failure. With the process of failure analysis, the key information, such as component's structure, sensitive parameters are identified. These results persuasively prove that FA techniques can provide much information to PHM system, including PoF and data-driven methods.
AB - Failure analysis (FA) is a basic and effective method to obtain the physical and failure information of electronic components and circuits. Most of these information can provide many useful evidences for prognostic and system health management (PHM) of electronic products. To obtain these information, many failure analysis techniques are used. This paper focuses on analyzing the relationship between FA techniques and PHM system. To test and verify the availability of the relationship between FA techniques and PHM system, a failure analysis case of an Intelligent Power Module (IPM) is used to study the relationship. This IPM contains six insulated gate bipolar transistors (IGBTs) and there are obvious burnout indications on most of them after failure. With the process of failure analysis, the key information, such as component's structure, sensitive parameters are identified. These results persuasively prove that FA techniques can provide much information to PHM system, including PoF and data-driven methods.
KW - Failure Analysis
KW - Insulated Gate Bipolar Transistors
KW - Intelligent Power Module
KW - Prognostic and System Health Management
UR - https://www.scopus.com/pages/publications/84966372755
U2 - 10.1109/PHM.2015.7380068
DO - 10.1109/PHM.2015.7380068
M3 - 会议稿件
AN - SCOPUS:84966372755
T3 - Proceedings of 2015 Prognostics and System Health Management Conference, PHM 2015
BT - Proceedings of 2015 Prognostics and System Health Management Conference, PHM 2015
A2 - Zhao, Tingdi
A2 - Pecht, Michael G.
A2 - Zhang, Shunong
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - Prognostics and System Health Management Conference, PHM 2015
Y2 - 21 October 2015 through 23 October 2015
ER -