TY - GEN
T1 - Unwanted turn-on of SiC JFET bi-directional switches under influence of parasitic parameters
AU - Wang, Lina
AU - Zhang, Xiangcai
AU - Deng, Jie
AU - Yang, Junyi
AU - Oladele, Olanrewaju Kabir
AU - Zhao, Yue
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/12/15
Y1 - 2017/12/15
N2 - SiC JFET bi-directional switches (BDS) are widely used in construction of matrix converters, multi-level converters, solid state switches, etc. In this research work, the phenomenon of unwanted turn-on (UTO) of SiC JFET-based BDS and its related constant envelop oscillation is investigated. This phenomenon is critical to power conversion systems' stability and reliability. Firstly, the roots of UTO are investigated by probing into the gate drive circuits, some theoretical analysis on the unique configuration of BDS is presented. Then some methods for mitigating the UTO behavior and constant envelop oscillation are proposed. Finally, the effectiveness of the proposed methods is verified by the experimental results.
AB - SiC JFET bi-directional switches (BDS) are widely used in construction of matrix converters, multi-level converters, solid state switches, etc. In this research work, the phenomenon of unwanted turn-on (UTO) of SiC JFET-based BDS and its related constant envelop oscillation is investigated. This phenomenon is critical to power conversion systems' stability and reliability. Firstly, the roots of UTO are investigated by probing into the gate drive circuits, some theoretical analysis on the unique configuration of BDS is presented. Then some methods for mitigating the UTO behavior and constant envelop oscillation are proposed. Finally, the effectiveness of the proposed methods is verified by the experimental results.
KW - SiC JFET
KW - bi-directional switch
KW - constant envelop oscillation
KW - direct-drive technology
KW - unwanted turn-on
UR - https://www.scopus.com/pages/publications/85046691350
U2 - 10.1109/IECON.2017.8216719
DO - 10.1109/IECON.2017.8216719
M3 - 会议稿件
AN - SCOPUS:85046691350
T3 - Proceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society
SP - 4194
EP - 4199
BT - Proceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017
Y2 - 29 October 2017 through 1 November 2017
ER -