摘要
InAs nanocrystals embedded in SiO2 matrix have been fabricated by a radio-frequency magnetron co-sputtering technique without postannealing. X-ray photoelectron spectra and Raman spectroscopy strongly suggest the existence of InAs nanocrystals in the SiO2 matrix. From the optical absorption spectrum, the absorption edge exhibits a very large blueshift of 3.3 eV with respect to that of bulk InAs. The double-peak ultraviolet photoluminescence is observed. Our experimental results show that this double-peak phenomenon originates from the radiative recombination of the quantum-confined electron-heavy hole excitons and electron-split-off hole excitons.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 2586-2588 |
| 页数 | 3 |
| 期刊 | Applied Physics Letters |
| 卷 | 70 |
| 期 | 19 |
| DOI | |
| 出版状态 | 已出版 - 12 5月 1997 |
| 已对外发布 | 是 |
学术指纹
探究 'Ultraviolet (340-390 nm), room temperature, photoluminescence from InAs nanocrystals embedded in SiO2 matrix' 的科研主题。它们共同构成独一无二的学术指纹。引用此
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