Ultrasensitive SERS Detection by Defect Engineering on Single Cu2O Superstructure Particle

Jie Lin; Yang Shang; Xiaoxia Li; Jian Yu; Xiaotian Wang; Lin Guo

doi:10.1002/adma.201604797

Ultrasensitive SERS Detection by Defect Engineering on Single Cu₂O Superstructure Particle

Jie Lin
, Yang Shang
, Xiaoxia Li
, Jian Yu
, Xiaotian Wang
, Lin Guo^*

^*此作品的通讯作者

化学学院

Beihang University

科研成果: 期刊稿件 › 文章 › 同行评审

378 引用（Scopus）

源语言	英语
文章编号	1604797
期刊	Advanced Materials
卷	29
期	5
DOI	https://doi.org/10.1002/adma.201604797
出版状态	已出版 - 2月 2017

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10.1002/adma.201604797

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链接到 Scopus 的出版物

引用此

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title = "Ultrasensitive SERS Detection by Defect Engineering on Single Cu2O Superstructure Particle",

keywords = "charge-transfer, defects, electrostatic adsorption, self-assembly, single-particle SERS",

author = "Jie Lin and Yang Shang and Xiaoxia Li and Jian Yu and Xiaotian Wang and Lin Guo",

year = "2017",

month = feb,

doi = "10.1002/adma.201604797",

language = "英语",

volume = "29",

journal = "Advanced Materials",

issn = "0935-9648",

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AU - Lin, Jie

AU - Shang, Yang

AU - Li, Xiaoxia

AU - Yu, Jian

AU - Wang, Xiaotian

AU - Guo, Lin

PY - 2017/2

Y1 - 2017/2

KW - charge-transfer

KW - defects

KW - electrostatic adsorption

KW - self-assembly

KW - single-particle SERS

UR - https://www.scopus.com/pages/publications/85006150662

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DO - 10.1002/adma.201604797

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AN - SCOPUS:85006150662

SN - 0935-9648

VL - 29

JO - Advanced Materials

JF - Advanced Materials

IS - 5

M1 - 1604797

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