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Transverse Error of ICP Piezoelectric Accelerometers and Its Correction Method in 6D Micro-vibration Excitation System

  • Yan Zheng*
  • , Zhicheng Zhou
  • , Hai Huang
  • *此作品的通讯作者
  • Beihang University
  • China Aerospace Science and Technology Corporation

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Due to the inherent transverse sensitivity of the piezoelectric accelerometer, it can cause transverse errors far beyond the resolution of the sensor in the measurement of a 6D micro-vibration excitation system(6D-MVES). The experiments are conducted to verify the effects of transverse errors on the measurement of 6D micro-vibration and vibration control. Moreover, the transverse sensitivity of the accelerometer and the positive direction of the transverse sensitivity axis are experimentally measured at the same time. Finally, the transverse sensitivity correction method using the transverse sensitivity correction matrix in 6D-MVES is proposed, and the improvement on the accuracy of micro-vibration measurement and control is verified by experiments.

源语言英语
主期刊名2021 3rd International Symposium on Robotics and Intelligent Manufacturing Technology, ISRIMT 2021
出版商Institute of Electrical and Electronics Engineers Inc.
362-367
页数6
ISBN(电子版)9781665437189
DOI
出版状态已出版 - 2021
活动3rd International Symposium on Robotics and Intelligent Manufacturing Technology, ISRIMT 2021 - Changzhou, 中国
期限: 24 9月 202126 9月 2021

出版系列

姓名2021 3rd International Symposium on Robotics and Intelligent Manufacturing Technology, ISRIMT 2021

会议

会议3rd International Symposium on Robotics and Intelligent Manufacturing Technology, ISRIMT 2021
国家/地区中国
Changzhou
时期24/09/2126/09/21

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