Transient velocity measurement of impact object via parallel low sampling rate sub-band signals processing

Doppler impact intensity measurement is widely applied in railway transportation and aerospace engineering for enhancing equipment robustness, reliability, and accelerometer accuracy. Data acquisition and processing still present challenges due to high frequency, non-stationarity, and large data volume. This study presents an in-situ transient velocity profile measurement system that segments Doppler intensity in the frequency domain and identifies the effective component on-chip. The system adopts a four channels acquisition structure that achieves dynamic data capture even when a single channel’s sampling rate is relatively low, while its method supports expansion to higher frequencies in future applications. A impact dynamics up to 63 MHz can be captured by data acquisition in four channels of only 31.25 mega sampling per second, and the computations is reduced by a half. For different velocities of mechanical impacts, the proposed method yields a smaller deviation compared with commercial LDV and accelerometer.