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TOTAL: Multi-Corners Timing Optimization Based on Transfer and Active Learning

  • Beihang University
  • Rockchip Electronics Co., Ltd.
  • Sichuan Normal University
  • Wuhan University of Technology
  • Zhejiang Lab

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

In modern advanced integrated circuit design, a design normally needs to be progressively optimized until the static timing analysis (STA) of full process corners meets the timing constraints. To improve efficiency, using machine learning to predict the path timings directly in order to reduce the extensive time-consuming SPICE simulations has become a promising technique to approach fast design closure. However, current methods lack both flexibility and reliability to be used in a practical industrial environment. To resolve these challenges, we propose TOTAL, which is constructed using a generalized linear model with latent features to effectively capture knowledge transferred from previous designs and delivers state-of-the-art (SOTA) prediction accuracy that is up to 6.6x improvement over the competitors in terms of mean absolute error (MAE). Most importantly, TOTAL is equipped with a Bayesian decision strategy to actively update uncertain predictions and deliver reliable predictions with accuracy close to 100%, pushing the frontier of the machine-learning-based STA for practical implementation.

源语言英语
主期刊名2023 60th ACM/IEEE Design Automation Conference, DAC 2023
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9798350323481
DOI
出版状态已出版 - 2023
活动60th ACM/IEEE Design Automation Conference, DAC 2023 - San Francisco, 美国
期限: 9 7月 202313 7月 2023

出版系列

姓名Proceedings - Design Automation Conference
2023-July
ISSN(印刷版)0738-100X

会议

会议60th ACM/IEEE Design Automation Conference, DAC 2023
国家/地区美国
San Francisco
时期9/07/2313/07/23

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