Thermal radiation characteristics of a SiC substrate thin-film with negative refractive index

Yi Cui; Yong Huang; Wen Li; Jun Wang

Thermal radiation characteristics of a SiC substrate thin-film with negative refractive index

Yi Cui^*
, Yong Huang
, Wen Li
, Jun Wang

^*此作品的通讯作者

航空科学与工程学院

Beihang University

科研成果: 期刊稿件 › 文章 › 同行评审

摘要

The thermal radiation characteristics of a SiC substrate thin-film with negative refractive index(NIM) is studied in this paper. Based on the transmit matrix method and Kirchhoff radiation law, the formula of the thermal radiation characteristics of NIM with SiC substrate is derived. By comparation, the influence of the NIM film on the thermal radiation characteristics of the SiC substrate is investigated. Results show that the thermal radiation characteristics of traditional semiconductor materials can be changed by a NIM thin-film. And the directional characteristics and spectral property can be modulated, by adjusting the system parameters of the thin-film structure.

源语言	英语
页（从-至）	2117-2120
页数	4
期刊	Kung Cheng Je Wu Li Hsueh Pao/Journal of Engineering Thermophysics
卷	31
期	12
出版状态	已出版 - 12月 2010

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@article{5877a5ac066941c980a16a6ee315300b,

title = "Thermal radiation characteristics of a SiC substrate thin-film with negative refractive index",

abstract = "The thermal radiation characteristics of a SiC substrate thin-film with negative refractive index(NIM) is studied in this paper. Based on the transmit matrix method and Kirchhoff radiation law, the formula of the thermal radiation characteristics of NIM with SiC substrate is derived. By comparation, the influence of the NIM film on the thermal radiation characteristics of the SiC substrate is investigated. Results show that the thermal radiation characteristics of traditional semiconductor materials can be changed by a NIM thin-film. And the directional characteristics and spectral property can be modulated, by adjusting the system parameters of the thin-film structure.",

keywords = "Coherence, Negative refractive index thin film, SiC substrate, Thermal radiation",

author = "Yi Cui and Yong Huang and Wen Li and Jun Wang",

year = "2010",

month = dec,

language = "英语",

volume = "31",

pages = "2117--2120",

journal = "Kung Cheng Je Wu Li Hsueh Pao/Journal of Engineering Thermophysics",

issn = "0253-231X",

publisher = "Science Press ",

number = "12",

}

TY - JOUR

T1 - Thermal radiation characteristics of a SiC substrate thin-film with negative refractive index

AU - Cui, Yi

AU - Huang, Yong

AU - Li, Wen

AU - Wang, Jun

PY - 2010/12

Y1 - 2010/12

N2 - The thermal radiation characteristics of a SiC substrate thin-film with negative refractive index(NIM) is studied in this paper. Based on the transmit matrix method and Kirchhoff radiation law, the formula of the thermal radiation characteristics of NIM with SiC substrate is derived. By comparation, the influence of the NIM film on the thermal radiation characteristics of the SiC substrate is investigated. Results show that the thermal radiation characteristics of traditional semiconductor materials can be changed by a NIM thin-film. And the directional characteristics and spectral property can be modulated, by adjusting the system parameters of the thin-film structure.

AB - The thermal radiation characteristics of a SiC substrate thin-film with negative refractive index(NIM) is studied in this paper. Based on the transmit matrix method and Kirchhoff radiation law, the formula of the thermal radiation characteristics of NIM with SiC substrate is derived. By comparation, the influence of the NIM film on the thermal radiation characteristics of the SiC substrate is investigated. Results show that the thermal radiation characteristics of traditional semiconductor materials can be changed by a NIM thin-film. And the directional characteristics and spectral property can be modulated, by adjusting the system parameters of the thin-film structure.

KW - Coherence

KW - Negative refractive index thin film

KW - SiC substrate

KW - Thermal radiation

UR - https://www.scopus.com/pages/publications/78650699144

M3 - 文章

AN - SCOPUS:78650699144

SN - 0253-231X

VL - 31

SP - 2117

EP - 2120

JO - Kung Cheng Je Wu Li Hsueh Pao/Journal of Engineering Thermophysics

JF - Kung Cheng Je Wu Li Hsueh Pao/Journal of Engineering Thermophysics

IS - 12

ER -

Thermal radiation characteristics of a SiC substrate thin-film with negative refractive index

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