TY - JOUR
T1 - Thermal barrier effect from internal pore channels on thickened aluminum nanofilm
AU - Qiu, Lin
AU - Ouyang, Yuxin
AU - Feng, Yanhui
AU - Zhang, Xinxin
AU - Wang, Xiaotian
AU - Wu, Jin
N1 - Publisher Copyright:
© 2020 Elsevier Masson SAS
PY - 2021/4
Y1 - 2021/4
N2 - High thermal conductivity nanofilms play a key role in the heat dissipation of microdevices, and the preparation process greatly influences the thermal conductivity of the nanofilms. In this study, four Al nanofilms with different thicknesses were fabricated via the electron beam evaporation method, and their effective thermal conductivity (ETC) values were measured using a specially designed microsensor-based third harmonic 3ω method. Due to the internal pore channels and nanometer-level feature size, the ETC of nanofilms exhibited a downward trend when the thickness increases. Significantly, the pores produced by the preparation induce the electron-phonon nonequilibrium effect inside the film, resulting in an anomalous change of the film thermal conductivity versus the thickness.
AB - High thermal conductivity nanofilms play a key role in the heat dissipation of microdevices, and the preparation process greatly influences the thermal conductivity of the nanofilms. In this study, four Al nanofilms with different thicknesses were fabricated via the electron beam evaporation method, and their effective thermal conductivity (ETC) values were measured using a specially designed microsensor-based third harmonic 3ω method. Due to the internal pore channels and nanometer-level feature size, the ETC of nanofilms exhibited a downward trend when the thickness increases. Significantly, the pores produced by the preparation induce the electron-phonon nonequilibrium effect inside the film, resulting in an anomalous change of the film thermal conductivity versus the thickness.
KW - 3ω method
KW - Interfacial thermal transport
KW - Pore effect
KW - Thermal conductivity
KW - Two-dimensional nanomaterials
UR - https://www.scopus.com/pages/publications/85098152650
U2 - 10.1016/j.ijthermalsci.2020.106781
DO - 10.1016/j.ijthermalsci.2020.106781
M3 - 文章
AN - SCOPUS:85098152650
SN - 1290-0729
VL - 162
JO - International Journal of Thermal Sciences
JF - International Journal of Thermal Sciences
M1 - 106781
ER -