TY - GEN
T1 - The simulation and measurement of scattering property and emissivity of the microwave radiometer calibrator
AU - Liang, Wenle
AU - Li, Xuan
AU - Miao, Jungang
AU - Liu, Dawei
PY - 2011
Y1 - 2011
N2 - The accuracy of measurement of calibrator emissivity is necessary for calibration of microwave radiometer. In this paper, the optimization of calibration source is presented, and the method of bistatic measurement system was chosen to measure the emissivity of calibration source, which is periodic cone array. The scattering property is measured and the emissivity of the calibrator is evaluated using bistatic measurement. The measurement is used to analyze scattering field of the calibrator as well as obtain the emissivity by integrating the differential scattering coefficient of the backscattered field.
AB - The accuracy of measurement of calibrator emissivity is necessary for calibration of microwave radiometer. In this paper, the optimization of calibration source is presented, and the method of bistatic measurement system was chosen to measure the emissivity of calibration source, which is periodic cone array. The scattering property is measured and the emissivity of the calibrator is evaluated using bistatic measurement. The measurement is used to analyze scattering field of the calibrator as well as obtain the emissivity by integrating the differential scattering coefficient of the backscattered field.
UR - https://www.scopus.com/pages/publications/84863296758
M3 - 会议稿件
AN - SCOPUS:84863296758
SN - 9781934142189
T3 - Progress in Electromagnetics Research Symposium
SP - 1403
EP - 1405
BT - PIERS 2011 Suzhou - Progress in Electromagnetics Research Symposium, Proceedings
T2 - Progress in Electromagnetics Research Symposium, PIERS 2011 Suzhou
Y2 - 12 September 2011 through 16 September 2011
ER -