TY - GEN
T1 - The research on fault equivalent analysis method in testability experiment validation
AU - Huang, Fuqun
AU - Xu, Ping
AU - Liu, Bin
AU - Li, Yue
PY - 2009
Y1 - 2009
N2 - With the existing fault injection techniques, many faults that can fully expose testability design defects can not be injected. To solve this problem, a method of fault equivalent analysis is proposed. By this means, some characteristics are extracted from the faults those unable to be injected, and "yield analysis" or "yielded analysis" is performed. Then the minimal cut sets of atom faults is obtained and selected, which are finally equivalent to the atom faults sequence. Applications show that the method not only solves the problem that many faults are not able to be injected, but also ensures the effect of testability experiment validation.
AB - With the existing fault injection techniques, many faults that can fully expose testability design defects can not be injected. To solve this problem, a method of fault equivalent analysis is proposed. By this means, some characteristics are extracted from the faults those unable to be injected, and "yield analysis" or "yielded analysis" is performed. Then the minimal cut sets of atom faults is obtained and selected, which are finally equivalent to the atom faults sequence. Applications show that the method not only solves the problem that many faults are not able to be injected, but also ensures the effect of testability experiment validation.
KW - Atom fault
KW - Equivalent analysis
KW - Fault characteristics
KW - Fault to be injected
KW - Testability experiment validation
UR - https://www.scopus.com/pages/publications/77955937585
U2 - 10.1109/ICRMS.2009.5269965
DO - 10.1109/ICRMS.2009.5269965
M3 - 会议稿件
AN - SCOPUS:77955937585
SN - 9781424449057
T3 - Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009
SP - 902
EP - 906
BT - Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009
T2 - 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009
Y2 - 20 July 2009 through 24 July 2009
ER -