摘要
The dielectric properties of FeNbO4 ceramics were systematically investigated in the frequency range from 100 Hz to 5 MHz and temperature from 75 to 300 K. It is observed that the sample exhibits colossal dielectric behavior and three dielectric relaxations. Both the low- and middle-temperature relaxations were found to be bulk effect related to localized carriers hopping. It is revealed that the low temperature relaxation is caused by the hopping motion of the self-trapped electrons and the middle temperature relaxation is related to the electrons hopping between Fe2+ and Fe3+ ions. By means of complex impedance analysis the high-temperature relaxation was argued to originate from Maxwell-Wagner relaxation due to grain boundary response.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 577-580 |
| 页数 | 4 |
| 期刊 | Journal of Alloys and Compounds |
| 卷 | 616 |
| DOI | |
| 出版状态 | 已出版 - 15 12月 2014 |
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