The accelerated degradation test and evaluation methods for printed circuit board coatings

Run Zhu; Xiaohui Wang; Xiaoming Ren

doi:10.1109/PHM.2014.6988218

The accelerated degradation test and evaluation methods for printed circuit board coatings

Run Zhu
, Xiaohui Wang
, Xiaoming Ren

可靠性与系统工程学院

Beihang University

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

3 引用（Scopus）

摘要

Based on the traditional neutral salt fog test, a newly step-stress accelerated degradation test is designed which adds temperature as a step-stress condition. It is proved that the test process is accelerated obviously. The degradation data measured from insulation resistance of printed circuit board could be fitted into degradation curves. Using Arrhenius Equation to build temperature accelerating equations, the reliability curves of the printed circuit board and the coating life could be predicted in salt fog test at 30'C. According to the results, it is found that the accelerated test is reasonable.

源语言	英语
主期刊名	Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014
出版商	Institute of Electrical and Electronics Engineers Inc.
页	474-477
页数	4
ISBN（电子版）	9781479979585
DOI	https://doi.org/10.1109/PHM.2014.6988218
出版状态	已出版 - 16 12月 2014
活动	2014 Prognostics and System Health Management Conference, PHM 2014 - Zhangiiaijie City, 中国期限: 24 8月 2014 → 27 8月 2014

出版系列

姓名	Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014

会议

会议	2014 Prognostics and System Health Management Conference, PHM 2014
国家/地区	中国
市	Zhangiiaijie City
时期	24/08/14 → 27/08/14

访问文件

10.1109/PHM.2014.6988218

其它文件与链接

链接到 Scopus 的出版物

引用此

Zhu, R., Wang, X., & Ren, X. (2014). The accelerated degradation test and evaluation methods for printed circuit board coatings. 在 Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014 (页码 474-477). 文章 6988218 (Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PHM.2014.6988218

Zhu, Run ; Wang, Xiaohui ; Ren, Xiaoming. / The accelerated degradation test and evaluation methods for printed circuit board coatings. Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014. Institute of Electrical and Electronics Engineers Inc., 2014. 页码 474-477 (Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014).

@inproceedings{1935c9a496ba4a71997f218a1602a373,

title = "The accelerated degradation test and evaluation methods for printed circuit board coatings",

abstract = "Based on the traditional neutral salt fog test, a newly step-stress accelerated degradation test is designed which adds temperature as a step-stress condition. It is proved that the test process is accelerated obviously. The degradation data measured from insulation resistance of printed circuit board could be fitted into degradation curves. Using Arrhenius Equation to build temperature accelerating equations, the reliability curves of the printed circuit board and the coating life could be predicted in salt fog test at 30'C. According to the results, it is found that the accelerated test is reasonable.",

keywords = "insulation resistance, salt fog test, step-stress accelerated degradation test",

author = "Run Zhu and Xiaohui Wang and Xiaoming Ren",

note = "Publisher Copyright: {\textcopyright} 2014 IEEE.; 2014 Prognostics and System Health Management Conference, PHM 2014 ; Conference date: 24-08-2014 Through 27-08-2014",

year = "2014",

month = dec,

day = "16",

doi = "10.1109/PHM.2014.6988218",

language = "英语",

series = "Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014",

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Zhu, R, Wang, X & Ren, X 2014, The accelerated degradation test and evaluation methods for printed circuit board coatings. 在 Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014., 6988218, Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014, Institute of Electrical and Electronics Engineers Inc., 页码 474-477, 2014 Prognostics and System Health Management Conference, PHM 2014, Zhangiiaijie City, 中国, 24/08/14. https://doi.org/10.1109/PHM.2014.6988218

The accelerated degradation test and evaluation methods for printed circuit board coatings. / Zhu, Run; Wang, Xiaohui; Ren, Xiaoming.
Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014. Institute of Electrical and Electronics Engineers Inc., 2014. 页码 474-477 6988218 (Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014).

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

TY - GEN

T1 - The accelerated degradation test and evaluation methods for printed circuit board coatings

AU - Zhu, Run

AU - Wang, Xiaohui

AU - Ren, Xiaoming

PY - 2014/12/16

Y1 - 2014/12/16

N2 - Based on the traditional neutral salt fog test, a newly step-stress accelerated degradation test is designed which adds temperature as a step-stress condition. It is proved that the test process is accelerated obviously. The degradation data measured from insulation resistance of printed circuit board could be fitted into degradation curves. Using Arrhenius Equation to build temperature accelerating equations, the reliability curves of the printed circuit board and the coating life could be predicted in salt fog test at 30'C. According to the results, it is found that the accelerated test is reasonable.

AB - Based on the traditional neutral salt fog test, a newly step-stress accelerated degradation test is designed which adds temperature as a step-stress condition. It is proved that the test process is accelerated obviously. The degradation data measured from insulation resistance of printed circuit board could be fitted into degradation curves. Using Arrhenius Equation to build temperature accelerating equations, the reliability curves of the printed circuit board and the coating life could be predicted in salt fog test at 30'C. According to the results, it is found that the accelerated test is reasonable.

KW - insulation resistance

KW - salt fog test

KW - step-stress accelerated degradation test

UR - https://www.scopus.com/pages/publications/84943140902

U2 - 10.1109/PHM.2014.6988218

DO - 10.1109/PHM.2014.6988218

M3 - 会议稿件

AN - SCOPUS:84943140902

T3 - Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014

SP - 474

EP - 477

BT - Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2014 Prognostics and System Health Management Conference, PHM 2014

Y2 - 24 August 2014 through 27 August 2014

ER -

Zhu R, Wang X, Ren X. The accelerated degradation test and evaluation methods for printed circuit board coatings. 在 Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014. Institute of Electrical and Electronics Engineers Inc. 2014. 页码 474-477. 6988218. (Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014). doi: 10.1109/PHM.2014.6988218

The accelerated degradation test and evaluation methods for printed circuit board coatings

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出版系列

会议

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