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Test image generation using segmental symbolic evaluation for unit testing

  • Tahir Jameel*
  • , Mengxiang Lin
  • , He Li
  • , Xiaomei Hou
  • *此作品的通讯作者
  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

This paper presents a novel technique to generate test images using segmental symbolic evaluation for testing of image processing applications. Images are multidimensional and diverse in nature, which leads to different challenges for the testing process. A technique is required to generate test images capable of finding program paths derived by image pixels. The proposed technique is based on symbolic execution which is extensively used for test data generation in recent years. In image processing applications, pixel operations such as averaging, convolution etc. are applied on a segment of input image pixels called window for a single iteration and repeated for the entire image. Our key idea is to imitate operations on pixel window using symbolic values rather than concrete ones to generate path constraints in the program under test. The path constraints generated for different paths are solved for concrete values using our simple SAT solver and the solutions are capable to guide program execution to the specific paths. The solutions of path constraints are used to generate synthetic test images for each identified path and the paths constraints which are not solvable for concrete pixel values are reported as infeasible paths. We have developed a tool IMSUITthat takes an image processing function as input and executes the program symbolically for the given pixels window to generate test images. Effectiveness of IMSUIT is tested on different modules of an optical character recognition system and the result shows that it can successfully create test images for each path of the program under test and capable of identifying infeasible paths.

源语言英语
主期刊名2014 IEEE/ACIS 15th International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing, SNPD 2014 - Proceedings
编辑Satoshi Takahashi, Ju Yeon Jo
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9781479956043
DOI
出版状态已出版 - 2014
活动15th IEEE/ACIS International Conference on Software Engineering, Artificial Intelligence, Networking, and Parallel/Distributed Computing, SNPD 2014 - Las Vegas, 美国
期限: 30 6月 20142 7月 2014

出版系列

姓名2014 IEEE/ACIS 15th International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing, SNPD 2014 - Proceedings

会议

会议15th IEEE/ACIS International Conference on Software Engineering, Artificial Intelligence, Networking, and Parallel/Distributed Computing, SNPD 2014
国家/地区美国
Las Vegas
时期30/06/142/07/14

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