TY - JOUR
T1 - Tensile characterization and constitutive modeling of sintered nano-silver particles over a range of strain rates and temperatures
AU - Qian, Cheng
AU - Gu, Tijian
AU - Wang, Ping
AU - Cai, Wei
AU - Fan, Xuejun
AU - Zhang, Guoqi
AU - Fan, Jiajie
N1 - Publisher Copyright:
© 2022 Elsevier Ltd
PY - 2022/5
Y1 - 2022/5
N2 - Sintered nano-silver die-attach materials have been widely used in high-power electronics packaging because of their high thermal and electrical conductivities. In this study, we characterized the tensile properties of sintered nano-silver particles over a range of strain rates and temperatures, and established the constitutive models. First, 50 nm nano-silver particles were sintered at 275 °C for 50 min as test samples, and their tensile tests were conducted under a dynamic thermomechanical analyzer (DMA Q800) and an IBTC 300SL in-situ mechanical test system respectively with different strain rates and ambient temperatures. Then, both Anand and variable-order fractional models (VoFM) were adopted to analyze the obtained stress-strain data and we studied their fitting accuracy and applicability. The results showed that: (1) The Young's modulus of the sintered nano-silver particles decreased with increasing temperature. In addition, the tensile strengths declined under lower strain rates and higher temperature conditions; (2) both the Anand model and VoFM characterized the tensile stress-strain properties of the sintered nano-silver material well. Compared to the Anand model, the VoFM utilized a simpler formula with fewer parameters and higher precision.
AB - Sintered nano-silver die-attach materials have been widely used in high-power electronics packaging because of their high thermal and electrical conductivities. In this study, we characterized the tensile properties of sintered nano-silver particles over a range of strain rates and temperatures, and established the constitutive models. First, 50 nm nano-silver particles were sintered at 275 °C for 50 min as test samples, and their tensile tests were conducted under a dynamic thermomechanical analyzer (DMA Q800) and an IBTC 300SL in-situ mechanical test system respectively with different strain rates and ambient temperatures. Then, both Anand and variable-order fractional models (VoFM) were adopted to analyze the obtained stress-strain data and we studied their fitting accuracy and applicability. The results showed that: (1) The Young's modulus of the sintered nano-silver particles decreased with increasing temperature. In addition, the tensile strengths declined under lower strain rates and higher temperature conditions; (2) both the Anand model and VoFM characterized the tensile stress-strain properties of the sintered nano-silver material well. Compared to the Anand model, the VoFM utilized a simpler formula with fewer parameters and higher precision.
KW - Anand model
KW - Constitutive model
KW - Nano-silver sintering
KW - Power electronics packaging
KW - Variable-order fractional model
UR - https://www.scopus.com/pages/publications/85127767623
U2 - 10.1016/j.microrel.2022.114536
DO - 10.1016/j.microrel.2022.114536
M3 - 文章
AN - SCOPUS:85127767623
SN - 0026-2714
VL - 132
JO - Microelectronics Reliability
JF - Microelectronics Reliability
M1 - 114536
ER -