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Tensile characterization and constitutive modeling of sintered nano-silver particles over a range of strain rates and temperatures

  • Cheng Qian
  • , Tijian Gu
  • , Ping Wang
  • , Wei Cai
  • , Xuejun Fan
  • , Guoqi Zhang
  • , Jiajie Fan*
  • *此作品的通讯作者
  • Fudan University
  • College of Mechanical and Electrical Engineering
  • Hohai University Changzhou
  • Lamar University
  • EEMCS Faculty
  • Delft University of Technology
  • Institute of Future Lighting

科研成果: 期刊稿件 › 文章 › 同行评审

摘要

Sintered nano-silver die-attach materials have been widely used in high-power electronics packaging because of their high thermal and electrical conductivities. In this study, we characterized the tensile properties of sintered nano-silver particles over a range of strain rates and temperatures, and established the constitutive models. First, 50 nm nano-silver particles were sintered at 275 °C for 50 min as test samples, and their tensile tests were conducted under a dynamic thermomechanical analyzer (DMA Q800) and an IBTC 300SL in-situ mechanical test system respectively with different strain rates and ambient temperatures. Then, both Anand and variable-order fractional models (VoFM) were adopted to analyze the obtained stress-strain data and we studied their fitting accuracy and applicability. The results showed that: (1) The Young's modulus of the sintered nano-silver particles decreased with increasing temperature. In addition, the tensile strengths declined under lower strain rates and higher temperature conditions; (2) both the Anand model and VoFM characterized the tensile stress-strain properties of the sintered nano-silver material well. Compared to the Anand model, the VoFM utilized a simpler formula with fewer parameters and higher precision.

源语言英语
期刊论文编号114536
期刊Microelectronics Reliability
卷132
DOI
出版状态已出版 - 5月 2022
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