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Study on Pulsed Electromagnetic Sensitivity of Typical Power IoT Device Nodes

  • Tong Wang*
  • , Lilin Li
  • *此作品的通讯作者
  • Beihang University

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

摘要

The sensing capability of power Internet of Things (IoT) systems highly relies on the data accuracy of perception-layer devices. However, such devices are prone to malfunctions during operation due to electromagnetic interference. To address this critical issue affecting the safe operation of the system, this paper presents a system-level electromagnetic sensitivity experimental study on typical device nodes. A repeatable conducted injection test platform is built, and more than 30 groups of representative pulse disturbance excitations are designed. Statistical analysis is carried out on the anomaly rate of sensor sampling data, communication interruption duration, and system recovery characteristics. Experimental results demonstrate that different excitation forms have obvious sensitive threshold intervals. The findings provide experimental support for the electromagnetic protection design and security assessment of power IoT terminals.

源语言英语
主期刊名2026 International Conference on Microwave and Millimeter Wave Technology, ICMMT 2026 - Proceedings
出版商Institute of Electrical and Electronics Engineers Inc.
版本2026
ISBN(电子版)9798319509628
DOI
出版状态已出版 - 2026
活动17th International Conference on Microwave and Millimeter Wave Technology, ICMMT 2026 - Shenzhen, 中国
期限: 9 5月 2026 → 12 5月 2026

会议

会议17th International Conference on Microwave and Millimeter Wave Technology, ICMMT 2026
国家/地区中国
市Shenzhen
时期9/05/26 → 12/05/26

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