摘要
The optical band gap (Eg) of the boron (B)-doped hydrogenated nano-crystalline silicon (nc-Si:H) films fabricated using plasma enhanced chemical vapor deposition (PECVD) was investigated in this work. The transmittance of the films were measured by spectrophotometric and the Eg was evaluated utilizing three different relations for comparison, namely: αhv=C(hv-Eg)3, αhv=B0(hv- Eg)2, 7alpha;hv=C0(hv-Eg)2. Result showed that Eg decreases with the increasing of Boron doping ratio, hydrogen concentration, and substrate's temperature (Ts), respectively. Eg raises up with rf power density (Pd) from 0.45W.cm-2 to 0.60w.cm-2 and then drops to the end. These can be explained for Eg decreases with disorder in the films.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 4327-4330 |
| 页数 | 4 |
| 期刊 | International Journal of Modern Physics B |
| 卷 | 16 |
| 期 | 28-29 |
| 出版状态 | 已出版 - 20 11月 2002 |
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