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Study on optical band GAP of boron-doped NC-SI:H film

  • Wei Wensheng*
  • , Wang Tianmin
  • , Zhang Chunxi
  • , Li Guohua
  • , Han Hexiang
  • , Ding Kun
  • *此作品的通讯作者
  • Beihang University
  • CAS - Institute of Semiconductors

科研成果: 期刊稿件文章同行评审

摘要

The optical band gap (Eg) of the boron (B)-doped hydrogenated nano-crystalline silicon (nc-Si:H) films fabricated using plasma enhanced chemical vapor deposition (PECVD) was investigated in this work. The transmittance of the films were measured by spectrophotometric and the Eg was evaluated utilizing three different relations for comparison, namely: αhv=C(hv-Eg)3, αhv=B0(hv- Eg)2, 7alpha;hv=C0(hv-Eg)2. Result showed that Eg decreases with the increasing of Boron doping ratio, hydrogen concentration, and substrate's temperature (Ts), respectively. Eg raises up with rf power density (Pd) from 0.45W.cm-2 to 0.60w.cm-2 and then drops to the end. These can be explained for Eg decreases with disorder in the films.

源语言英语
页(从-至)4327-4330
页数4
期刊International Journal of Modern Physics B
16
28-29
出版状态已出版 - 20 11月 2002

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