Study on field demonstration method for quantitative built-in test requirements

The definition and implementing flow of the field demonstration method for quantitative built-in test (BIT) requirements are described. The sample sizes of the integrated demonstration for BIT fault detection rate, fault isolation rate and false alarm rate are computed according to the needs of confidence level and functional unites coverage. And the eligible judgments are made based on the single confidence limits of BIT parameters. The statistic judgment, classification flow and uniform recording table for fault data are given. An application case shows the feasibility of the method.