Study of reliability integrated assessment method based on performance, environmental and reliability tests for electronic products

The paper constructs the multi-regress-analysis reliability assessment method based on the exponential regression model due to the possible fewer samples for testing in electronic products reliability assessment. By introducing environmental severe degree factors, environmental integrated factors and technique states of the product factors, the multiregress- analysis reliability assessment method is established and product reliability assessment is implemented based on performance test data, environmental test data, and reliability test data. When using this method, the time data does not need to be converted under different environment, and the regression parameters will be calculated to give the pertinent reliability parameters, which is quite different from the classic environmental-changing and maternal-changing reliability integrated assessment method.