跳到主要导航 跳到搜索 跳到主要内容

Structures, stabilities, and electronic properties of defects in monolayer black phosphorus

  • Xi Bo Li
  • , Pan Guo
  • , Teng Fei Cao
  • , Hao Liu
  • , Woon Ming Lau
  • , Li Min Liu*
  • *此作品的通讯作者
  • China Academy of Engineering Physics
  • Chengdu Green Energy and Green Manufacturing Technology R and D Center

科研成果: 期刊稿件文章同行评审

摘要

The structures, stabilities, and electronic properties of monolayer black phosphorus (M-BP) with different kinds of defects are investigated within the frame of density-functional theory. All the possible configurations of defects in M-BP are explored, and the calculated results suggest that the stabilities of the configurations with different kinds of defects are greatly related to broken bonds, structural deformation and the character of the bonding. The configurations with two or three vacancies are energetically more favorable than the ones with a single vacancy. Meanwhile, the doping of two foreign atoms, such as sulfur, silicon or aluminum, is more stable than that of the corresponding single dopant. The electronic properties of M-BP are greatly affected by the types of defects. The single S-doped M-BP not only retains the character of a direct semiconductor, but it also can enlarge the band gap by 0.24 eV relative to the perfect one. Such results reveal that the defects not only greatly affect the electronic properties, but they also can be used as an effective way to modulate the band gap for the different applications of M-BP in electronic devices.

源语言英语
期刊论文编号10848
期刊Scientific Reports
5
DOI
出版状态已出版 - 2 6月 2015
已对外发布

学术指纹

探究 'Structures, stabilities, and electronic properties of defects in monolayer black phosphorus' 的科研主题。它们共同构成独一无二的学术指纹。

引用此