摘要
Epitaxial (Zn1-xMgx)1-yMnyO thin films were grown on c-Al2O3 substrates by radio frequency oxygen plasma assisted molecular beam epitaxy. Single crystal structure of the (Zn1-xMgx)1-yMnyO films was revealed by reflection high energy electron diffraction and X-ray diffraction. The band gap of the films can be tuned dramatically with increasing the Mg concentration, while the onset energy of Mn-related mid-gap absorption band only shows a small blue shift. Photoconductivity measurements indicate the Mn-related mid-gap states in (Zn1-xMgx) 1-yMnyO films can create free carriers and contribute to charge transfer transitions. The conduction band offset ΔEC 0.13 eV and valence band offset ΔEV 0.1 eV were obtained for ZnO/Zn0.8Mg0.2O heterostructures, which increase to ΔEC 0.21 eV and ΔEV 0.14 eV for ZnO/Zn 0.7Mg0.3O heterostructures.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 173701 |
| 期刊 | Journal of Applied Physics |
| 卷 | 113 |
| 期 | 17 |
| DOI | |
| 出版状态 | 已出版 - 7 5月 2013 |
| 已对外发布 | 是 |
指纹
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