摘要
Self-assembled In0.9Ga0.1As, In0.9Al0.1As, and InAs quantum dots (QD) were fabricated in an InAlAs matrix lattice-matched to an InP substrate by molecular beam epitaxy. Preliminary characterizations were performed using transmission electron microscopy, photoluminescence, and reflection high-energy electron diffraction. Experimental results reveal clear differences in QD formation, size distribution, and luminescence between the InAs and In0.9(Ga/Al)0.1 As samples, which show the potential of introducing ternary compositions to adjust the structural and optical properties of QDs on an InP substrate.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 533-536 |
| 页数 | 4 |
| 期刊 | Journal of Applied Physics |
| 卷 | 88 |
| 期 | 1 |
| DOI | |
| 出版状态 | 已出版 - 7月 2000 |
| 已对外发布 | 是 |
指纹
探究 'Structural and photoluminescence properties of In0.9(Ga/Al)0.1As self-assembled quantum dots on InP substrate' 的科研主题。它们共同构成独一无二的指纹。引用此
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