摘要
The burgeoning field of twistronics, which concerns how changing the relative twist angles between two materials creates new optoelectronic properties, offers a novel platform for studying twist-angle dependent excitonic physics. Herein, by surveying a range of hexagonal phase transition metal dichalcogenides (TMD) twisted homobilayers, we find that 21.8 ± 1.0°-twisted (Formula Presented) and 27.8 ± 1.0°-twisted (Formula Presented) bilayers account for nearly 20% of the total population of twisted bilayers in solution-phase restacked bilayers and can be found also in chemical vapor deposition (CVD) samples. Examining the optical properties associated with these twisted angles, we found that 21.8 ± 1.0° twisted MoS2 bilayers exhibit an intense moiré exciton peak in the photoluminescence (PL) spectra, originating from the refolded Brillouin zones. Our work suggests that commensurately twisted TMD homobilayers with short commensurate wavelengths can have interesting optoelectronic properties that are different from the small twist angle counterparts.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 203-210 |
| 页数 | 8 |
| 期刊 | Nano Letters |
| 卷 | 22 |
| 期 | 1 |
| DOI | |
| 出版状态 | 已出版 - 12 1月 2022 |
| 已对外发布 | 是 |
指纹
探究 'Strong Moiré Excitons in High-Angle Twisted Transition Metal Dichalcogenide Homobilayers with Robust Commensuration' 的科研主题。它们共同构成独一无二的指纹。引用此
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