Storage life evaluation method for missile-borne products integrating information from design and testing

Storage life evaluation of missile-borne products do not fully utilize design information, and failure criteria do not directly reflect the failure mechanisms during the depletion phase. Conducting an in-depth study on storage life evaluation under multi-parameter coupling while considering these issues is of great significance. In regard to this, a storage life evaluation method for evaluating the storage life of missile-borne products by integrating multiple sources of design and experimental information is proposed. Firstly, a storage life characterization index is established using failure rate as the lifespan criterion, the influencing factors of storage life is analyzed, and the sources of design and test information is clarified. Secondly, based on the generalized stress-strength interference model, a product failure rate model is constructed that comprehensively considers the discreteness of design parameters, the randomness of storage conditions, and the degradation of performance parameters. Thirdly, the failure rate model is generalized to a multi-parameter scenario using the Copula function. Given a failure rate threshold, the storage life is estimated through genetic algorithm. Finally, taking a control amplifier as an example, the effectiveness of the proposed method is verified. The analysis shows that the proposed method effectively solves the problem of design parameters being unrelated to storage life indicators, providing strong support for the positive design and accurate evaluation of storage life.