摘要
Nitrogen doping is identified to be a sufficient way to reduce the power consumption of Ge2 Sb2 Te5, a phase-change material for data storage. On the basis of ab initio molecular dynamics simulations, we show that the doped N in amorphous Ge2 Sb2 Te5 coexist as Ge(Sb, Te)N complex and N2, and high density of the film produces more N2. Furthermore, both Ge(Sb, Te)N complex and N2 are stable upon annealing at 600 K.
| 源语言 | 英语 |
|---|---|
| 期刊论文编号 | 241908 |
| 期刊 | Applied Physics Letters |
| 卷 | 93 |
| 期 | 24 |
| DOI | |
| 出版状态 | 已出版 - 2008 |
| 已对外发布 | 是 |
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