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Spectral-spatial Outlier Filter for Image Matching

  • Junfu Zhou
  • , Ting Bing Xu
  • , Zhenzhong Wei*
  • *此作品的通讯作者
  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Feature-based image matching is often contaminated by some mismatches due to the limited representation of descriptors. Existing two-stage mismatch removal filters usually select some seed points first and then remove outliers according to the consistency in neighborhoods. However, the filter's performance is directly influenced by the selection of effective seed points. In this paper, we design an elegant Spectral-spatial Outlier Filter (SOF) to harvest high-accuracy image matching. Specifically, we first calculate eigenvectors of Laplacian matrix from the joint image graph as feature descriptors in the spectral domain to select more reasonable seed points, and then these points are fed into the local affine verification in the spatial domain in the second stage to effectively remove outliers. Experimental results on challenging datasets demonstrate that the proposed filter further improves the precision of image matching, and steadily outperforms other state-of-the-art methods.

源语言英语
主期刊名2021 International Conference on Optical Instruments and Technology
主期刊副标题Optoelectronic Measurement Technology and Systems
编辑Jigui Zhu, Lijiang Zeng, Jie Jiang, Sen Han
出版商SPIE
ISBN(电子版)9781510655690
DOI
出版状态已出版 - 2022
活动2021 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Virtual, Online, 中国
期限: 8 4月 202210 4月 2022

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
12282
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议2021 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
国家/地区中国
Virtual, Online
时期8/04/2210/04/22

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