摘要
Self-assembled In 0.4 Ga 0.6 As island arrays have been grown on (3 1 1)B GaAs substrates by using atomic hydrogen-assisted molecular beam epitaxy (H-MBE). The evolution process of surface morphology with deposition has been analyzed by atomic force microscopy (AFM) and the development of lateral ordering has been highlighted by two-dimensional fast Fourier transformation (2DFFT) analysis of the AFM images. It is revealed that the InGaAs islands are arranged in nearly perfect two-dimensional (2D) square-like lattice with two sides parallel to [0 1 -1] and [-2 3 3] azimuths. Such an alignment of islands is coincident with the anisotropy of bulk elastic modulus of the GaAs (3 1 1)B substrate.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 92-98 |
| 页数 | 7 |
| 期刊 | Applied Surface Science |
| 卷 | 185 |
| 期 | 1-2 |
| DOI | |
| 出版状态 | 已出版 - 28 12月 2001 |
| 已对外发布 | 是 |
学术指纹
探究 'Spatial alignment evolution of self-assembled In 0.4 Ga 0.6 As island arrays grown on GaAs (3 1 1)B surface by atomic hydrogen-assisted molecular beam epitaxy' 的科研主题。它们共同构成独一无二的学术指纹。引用此
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