TY - GEN
T1 - Sparse representation in electrical resistance tomography based on extended sensitivity matrix
AU - Ye, Jiamin
AU - Wang, Haigang
AU - Qiu, Guizhi
AU - Yang, Wuqiang
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014/11/14
Y1 - 2014/11/14
N2 - Electrical resistance tomography is a soft-field tomography technique, i.e. the electrical field is changed everywhere in the sensing area with the change of conductivity in any pixel. To improve the image quality, an extended sensitivity matrix is designed in this paper. The base conductivity elements in the extended sensitivity matrix are consisted of a series of blocks with different number of pixels at all possible locations in the sensing region. Based on the new sensitivity matrix, a sparse representation method is implemented to reconstruct the conductivity distribution of cross-sectional area. Simulation results show that the proposed method based on the extended sensitivity matrix can reconstruct the image with a high quality.
AB - Electrical resistance tomography is a soft-field tomography technique, i.e. the electrical field is changed everywhere in the sensing area with the change of conductivity in any pixel. To improve the image quality, an extended sensitivity matrix is designed in this paper. The base conductivity elements in the extended sensitivity matrix are consisted of a series of blocks with different number of pixels at all possible locations in the sensing region. Based on the new sensitivity matrix, a sparse representation method is implemented to reconstruct the conductivity distribution of cross-sectional area. Simulation results show that the proposed method based on the extended sensitivity matrix can reconstruct the image with a high quality.
KW - electrical resistance tomography
KW - image reconstruction
KW - resistance sensor
UR - https://www.scopus.com/pages/publications/84916630435
U2 - 10.1109/IST.2014.6958443
DO - 10.1109/IST.2014.6958443
M3 - 会议稿件
AN - SCOPUS:84916630435
T3 - IST 2014 - 2014 IEEE International Conference on Imaging Systems and Techniques, Proceedings
SP - 43
EP - 47
BT - IST 2014 - 2014 IEEE International Conference on Imaging Systems and Techniques, Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2014 IEEE International Conference on Imaging Systems and Techniques, IST 2014
Y2 - 14 October 2014 through 17 October 2014
ER -