TY - GEN
T1 - Simulation on measuring of nonuniform temperature distribution based on line-of-sight TDLAS by using Tikhonov regularization method
AU - Liu, Chang
AU - Xu, Lijun
AU - Cao, Zhang
AU - Qian, Zheng
PY - 2012
Y1 - 2012
N2 - In this paper, Tikhonov regularization method, with its regularization parameter determined by L-curve criterion, is applied to measure nonuniform temperature distribution based on line-of-sight tunable diode laser absorption spectroscopy (TDLAS) through simulation. By using temperature binning method, number of bins should be increased in order to resolve the temperature distribution more definitely. However, the sensitivity matrix becomes more ill-conditioned. Compared with constrained linear least-square fitting method, Tikhonov regularization method is more robust in dealing with the discrete ill-posed problem. The simulated results validated the feasibility of this approach.
AB - In this paper, Tikhonov regularization method, with its regularization parameter determined by L-curve criterion, is applied to measure nonuniform temperature distribution based on line-of-sight tunable diode laser absorption spectroscopy (TDLAS) through simulation. By using temperature binning method, number of bins should be increased in order to resolve the temperature distribution more definitely. However, the sensitivity matrix becomes more ill-conditioned. Compared with constrained linear least-square fitting method, Tikhonov regularization method is more robust in dealing with the discrete ill-posed problem. The simulated results validated the feasibility of this approach.
KW - ill-posed problem
KW - line-of-sight TDLAS
KW - temperature distribution
KW - Tikhonov regularization method
UR - https://www.scopus.com/pages/publications/84867295907
U2 - 10.1109/ISICT.2012.6291608
DO - 10.1109/ISICT.2012.6291608
M3 - 会议稿件
AN - SCOPUS:84867295907
SN - 9781467326162
T3 - 2012 the 8th IEEE International Symposium on Instrumentation and Control Technology, ISICT 2012 - Proceedings
SP - 92
EP - 95
BT - 2012 the 8th IEEE International Symposium on Instrumentation and Control Technology, ISICT 2012 - Proceedings
T2 - 8th IEEE International Symposium on Instrumentation and Control Technology, ISICT 2012
Y2 - 11 July 2012 through 13 July 2012
ER -