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Simulation about the conditioning circuit of sensor

  • N. Li*
  • , J. F. Lu
  • , Y. T. Li
  • , M. Yuan
  • *此作品的通讯作者
  • Beihang University

科研成果: 期刊稿件文章同行评审

摘要

In testing system, measuring small signals is necessary. The conditioning circuit is a crucial section, and its reliability has a great influence on the whole testing system. By using the method of computer simulation and thermal analysis, the functions of the circuit can be simulated and relevant parameters can be optimized previously to promote the circuit's capability. By this means, the research time can be dramatically shortened and the expense can be more less. Therefore, these methods have a great value in practice.

源语言英语
页(从-至)280-283
页数4
期刊Beijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics
27
3
出版状态已出版 - 6月 2001

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