TY - GEN
T1 - Signal Analysis Based on Time-frequency Transformation and Deep Learning
AU - Hu, Yiyun
AU - Dai, Fei
AU - Li, Shuang
AU - Chen, Xingye
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - This paper explores time-frequency transformation techniques, object detection and deep learning-based recognition methods for four basic electromagnetic interference (EMI) waveforms in electromagnetic compatibility (EMC) testing. A Short-Time Fourier Transform (STFT)-based feature representation is proposed to overcome the limitations of traditional spectrum analysis. The integration of the DEtection-TRansformer (DETR) model and the Multilayer Perceptron (MLP) is employed for target detection and parameter extraction of EMI basic signals in time-frequency spectral images. In the switch-mode power supply (SMPS) experiment, the parasitic parameter prediction errors of the circuit diode were all below 2%. The proposed approach improves the convenience and accuracy of EMI signal classification and parameter prediction.
AB - This paper explores time-frequency transformation techniques, object detection and deep learning-based recognition methods for four basic electromagnetic interference (EMI) waveforms in electromagnetic compatibility (EMC) testing. A Short-Time Fourier Transform (STFT)-based feature representation is proposed to overcome the limitations of traditional spectrum analysis. The integration of the DEtection-TRansformer (DETR) model and the Multilayer Perceptron (MLP) is employed for target detection and parameter extraction of EMI basic signals in time-frequency spectral images. In the switch-mode power supply (SMPS) experiment, the parasitic parameter prediction errors of the circuit diode were all below 2%. The proposed approach improves the convenience and accuracy of EMI signal classification and parameter prediction.
KW - Electromagnetic interference(EMI)
KW - detection-transformer(DETR)
KW - emission source identification
KW - short-time fourier transform(STFT)
UR - https://www.scopus.com/pages/publications/105019495965
U2 - 10.1109/IWS65943.2025.11177924
DO - 10.1109/IWS65943.2025.11177924
M3 - 会议稿件
AN - SCOPUS:105019495965
T3 - 2025 IEEE MTT-S International Wireless Symposium, IWS 2025 - Proceedings
BT - 2025 IEEE MTT-S International Wireless Symposium, IWS 2025 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 12th IEEE MTT-S International Wireless Symposium, IWS 2025
Y2 - 19 May 2025 through 22 May 2025
ER -