Seebeck coefficient of nanostructured phosphorus-alloyed bismuth telluride thick films

J. Zhou; S. Li; H. M.A. Soliman; M. S. Toprak; M. Muhammed; D. Platzek; E. Müller

doi:10.1016/j.jallcom.2008.03.088

Seebeck coefficient of nanostructured phosphorus-alloyed bismuth telluride thick films

J. Zhou^*
, S. Li
, H. M.A. Soliman
, M. S. Toprak
, M. Muhammed
, D. Platzek
, E. Müller

^*此作品的通讯作者

Xiamen University
KTH Royal Institute of Technology
German Aerospace Center

科研成果: 期刊稿件 › 文章 › 同行评审

19 引用（Scopus）

摘要

Nanostructured phosphorous-alloyed Bi₂Te₃ thick films have been prepared by electrochemical deposition. The average grain size of the films was calculated to be 14-26 nm based on Scherrer's equation. The effect of P on the Seebeck coefficient of the Bi₂Te₃ thick film was investigated. The results show that P-alloyed thick film has n-type conductivity with the Seebeck coefficient of -35 μV/K. The correlation between P site occupancy in the crystal and the Seebeck coefficient was discussed.

源语言	英语
页（从-至）	278-281
页数	4
期刊	Journal of Alloys and Compounds
卷	471
期	1-2
DOI	https://doi.org/10.1016/j.jallcom.2008.03.088
出版状态	已出版 - 5 3月 2009
已对外发布	是

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@article{4c4d3926291847e1903bd9555c040a43,

title = "Seebeck coefficient of nanostructured phosphorus-alloyed bismuth telluride thick films",

abstract = "Nanostructured phosphorous-alloyed Bi2Te3 thick films have been prepared by electrochemical deposition. The average grain size of the films was calculated to be 14-26 nm based on Scherrer's equation. The effect of P on the Seebeck coefficient of the Bi2Te3 thick film was investigated. The results show that P-alloyed thick film has n-type conductivity with the Seebeck coefficient of -35 μV/K. The correlation between P site occupancy in the crystal and the Seebeck coefficient was discussed.",

keywords = "Microstructure, Seebeck microprobe, Thermoelectric materials",

author = "J. Zhou and S. Li and Soliman, \{H. M.A.\} and Toprak, \{M. S.\} and M. Muhammed and D. Platzek and E. M{\"u}ller",

year = "2009",

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doi = "10.1016/j.jallcom.2008.03.088",

language = "英语",

volume = "471",

pages = "278--281",

journal = "Journal of Alloys and Compounds",

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TY - JOUR

T1 - Seebeck coefficient of nanostructured phosphorus-alloyed bismuth telluride thick films

AU - Zhou, J.

AU - Li, S.

AU - Soliman, H. M.A.

AU - Toprak, M. S.

AU - Muhammed, M.

AU - Platzek, D.

AU - Müller, E.

PY - 2009/3/5

Y1 - 2009/3/5

N2 - Nanostructured phosphorous-alloyed Bi2Te3 thick films have been prepared by electrochemical deposition. The average grain size of the films was calculated to be 14-26 nm based on Scherrer's equation. The effect of P on the Seebeck coefficient of the Bi2Te3 thick film was investigated. The results show that P-alloyed thick film has n-type conductivity with the Seebeck coefficient of -35 μV/K. The correlation between P site occupancy in the crystal and the Seebeck coefficient was discussed.

AB - Nanostructured phosphorous-alloyed Bi2Te3 thick films have been prepared by electrochemical deposition. The average grain size of the films was calculated to be 14-26 nm based on Scherrer's equation. The effect of P on the Seebeck coefficient of the Bi2Te3 thick film was investigated. The results show that P-alloyed thick film has n-type conductivity with the Seebeck coefficient of -35 μV/K. The correlation between P site occupancy in the crystal and the Seebeck coefficient was discussed.

KW - Microstructure

KW - Seebeck microprobe

KW - Thermoelectric materials

UR - https://www.scopus.com/pages/publications/60849119581

U2 - 10.1016/j.jallcom.2008.03.088

DO - 10.1016/j.jallcom.2008.03.088

M3 - 文章

AN - SCOPUS:60849119581

SN - 0925-8388

VL - 471

SP - 278

EP - 281

JO - Journal of Alloys and Compounds

JF - Journal of Alloys and Compounds

IS - 1-2

ER -

Seebeck coefficient of nanostructured phosphorus-alloyed bismuth telluride thick films

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