TY - GEN
T1 - Running-in of sidewall friction in bulk-fabricated microtribotester
AU - Meng, Yonggang
AU - Guo, Zhanshe
AU - Wu, Hao
PY - 2008
Y1 - 2008
N2 - Sidewall friction is of great significance for many MEMS devices such as micromotors, microgears and microhinges. Because sidewalls in MEMS devices are different from inplane surfaces both chemically and topographically, friction and wear occurring on sidewalls are expected to have its own characteristics. A microtribotester has been developed with the bulk-fabrication technology to measure the sidewall friction and wear, and static friction and dynamic friction measurements have been reported previously. In this paper, experiment results of the microtribotester for a testing period of 55 hours are presented. It is found that the coefficient of dynamic friction reduces gradually with the increase in rubbing cycle, being similar to most macroscale tribopairs. The morphology and chemical components of the wear debris generated in the testing process were analyzed on scanning electron microscope and EDX. From the analysis results, it is concluded that the silicon sidewalls undergoes oxidation during the test.
AB - Sidewall friction is of great significance for many MEMS devices such as micromotors, microgears and microhinges. Because sidewalls in MEMS devices are different from inplane surfaces both chemically and topographically, friction and wear occurring on sidewalls are expected to have its own characteristics. A microtribotester has been developed with the bulk-fabrication technology to measure the sidewall friction and wear, and static friction and dynamic friction measurements have been reported previously. In this paper, experiment results of the microtribotester for a testing period of 55 hours are presented. It is found that the coefficient of dynamic friction reduces gradually with the increase in rubbing cycle, being similar to most macroscale tribopairs. The morphology and chemical components of the wear debris generated in the testing process were analyzed on scanning electron microscope and EDX. From the analysis results, it is concluded that the silicon sidewalls undergoes oxidation during the test.
UR - https://www.scopus.com/pages/publications/43449101913
U2 - 10.1115/IJTC2007-44471
DO - 10.1115/IJTC2007-44471
M3 - 会议稿件
AN - SCOPUS:43449101913
SN - 0791848108
SN - 9780791848104
T3 - 2007 Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2007
SP - 897
EP - 899
BT - 2007 Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2007
T2 - 2007 ASME/STLE International Joint Tribology Conference, IJTC 2007
Y2 - 22 October 2007 through 24 October 2007
ER -