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Rubber lifetime prediction for ADT data considering non-arrhenius behavior

  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

In reliability engineering, accelerated degradation test (ADT) has been widely used to obtain adequate data within a reasonable period of time. All test units are exposed on higher-than-usual stress levels so that extrapolation is needed to predict actual performance in normal condition. When the accelerated stress is temperature, the commonly used extrapolation methods are based on linear Arrhenius model which has been proved inadequacy over a wide range of temperatures in recent literatures. Therefore this paper focuses on the non-Arrhenius model due to two competing processes which is consistent with our experience that there were two competitive reactions, cross-link or degradation during the aging of rubber. Motivated by a rubber degradation data, we introduce a lifetime prediction method for ADT data taking non-Arrhenius behavior into consideration, and the lifetime distribution of the rubber under normal condition is obtained. Then the validity of non-Arrhenius ADT model is illustrated based on the rubber data and the result indicates a good fit for the degradation data. Finally, we investigate the effects of model misspecification. The results reveal that in normal condition the p-quantile under an incorrect model is overestimated. Meanwhile, the effect resulted by incorrect acceleration model on degradation model parameter is quite severe under temperatures higher than 120° C or lower than 50° C. Moreover, there are still some points should be emphasize: (1) The non-Arrhenius behavior is discovered in a part of polymers, but it doesn't mean the phenomenon is inevitable. In addition, this behavior manifests in a relatively wide range of temperatures, so the non-Arrhenius model is not suitable for tests conducted over a small temperature region. (2) The degradation path model used in this paper can be extended to similar degradation path models as well as stochastic process models according to the practical requirement. (3) In this paper, we concluded that the non-Arrhenius ADT model considering two competing processes fits better for the degradation paths through statistical method. This conclusion should be further demonstrated by degradation mechanism analysis. (4) There are various non-Arrhenius models, such as the quadratic Arrhenius model [15]. Consequently, a procedure discriminating among different non-Arrhenius models will be very useful for further research.

源语言英语
主期刊名2017 Annual Reliability and Maintainability Symposium, RAMS 2017
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9781509052844
DOI
出版状态已出版 - 29 3月 2017
活动2017 Annual Reliability and Maintainability Symposium, RAMS 2017 - Orlando, 美国
期限: 23 1月 201726 1月 2017

出版系列

姓名Proceedings - Annual Reliability and Maintainability Symposium
ISSN(印刷版)0149-144X

会议

会议2017 Annual Reliability and Maintainability Symposium, RAMS 2017
国家/地区美国
Orlando
时期23/01/1726/01/17

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