跳到主要导航 跳到搜索 跳到主要内容

Research on test adapter framework for distributed TTCN-3 test execution platform

  • Guan Wang*
  • , Ji Wu
  • , Luo Xu
  • , Mao Zhong Jin
  • *此作品的通讯作者
  • Beihang University

科研成果: 期刊稿件文章同行评审

摘要

Because distributed system had features of physical distribution, simultaneous access, being sensitive to sequence and platform isomerism, distributed test system must fit those features. TTCN-3 distributed test execution platform was able to fulfill requirements of distributes test. However, with the feature of static binding test adapter, TTCN-3 test system can not communicate with different kinds of SUTs at a single test execution node. Therefore the concept of test adapter framework was present in this paper. On the basis of fundamental adaptation with supporting TTCN-3 standard interface, the framework integrated test adapters for different kinds of SUTs, dynamically selected and used adaptive test adapter. As a result, the framework fulfills requirements of TTCN-3 distributed test execution platform, and strengthens the ability of TTCN-3 for distributed test domain as well.

源语言英语
页(从-至)125-130+117
期刊Tien Tzu Hsueh Pao/Acta Electronica Sinica
37
SUPPL.
出版状态已出版 - 4月 2009

指纹

探究 'Research on test adapter framework for distributed TTCN-3 test execution platform' 的科研主题。它们共同构成独一无二的指纹。

引用此