TY - GEN
T1 - Research on Reliability Enhancement Technology of Real-Time Operating System
AU - Shuang, Xiaochuan
AU - Wei, Jie
AU - Niu, Jianwei
AU - Feng, Shuyi
AU - Bai, Liang
AU - You, Hongjun
AU - Tian, Wenbo
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - In the process of continuous Intelligentization of satellite applications, it has become inevitable to equip on-board computers with real-time operating system software. Considering the complexity of the space radiation environment which mainly includes electrons, protons and heavy ions, it is of great significance to improve the reliability of the real-time operating system to achieve application programs insensitivity to radiation effects. This paper presents reliability enhancement technical scheme for real-time operation system software. Five energy pointirradiation tests were carried out in Xi'an. The real-time operating system does not have abnormal resets, which verifies the effectiveness of the reliability enhancement technology.
AB - In the process of continuous Intelligentization of satellite applications, it has become inevitable to equip on-board computers with real-time operating system software. Considering the complexity of the space radiation environment which mainly includes electrons, protons and heavy ions, it is of great significance to improve the reliability of the real-time operating system to achieve application programs insensitivity to radiation effects. This paper presents reliability enhancement technical scheme for real-time operation system software. Five energy pointirradiation tests were carried out in Xi'an. The real-time operating system does not have abnormal resets, which verifies the effectiveness of the reliability enhancement technology.
KW - radiation effect
KW - realtime operating system
KW - reliability enhancement
UR - https://www.scopus.com/pages/publications/105010223068
U2 - 10.1109/ICREED65908.2025.11036198
DO - 10.1109/ICREED65908.2025.11036198
M3 - 会议稿件
AN - SCOPUS:105010223068
T3 - 2025 6th International Conference on Radiation Effects of Electronic Devices, ICREED 2025
BT - 2025 6th International Conference on Radiation Effects of Electronic Devices, ICREED 2025
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 6th International Conference on Radiation Effects of Electronic Devices, ICREED 2025
Y2 - 16 April 2025 through 18 April 2025
ER -