Research on Pin Combination Optimization Technology of ESD Human Body Model Test Based on Pseudo-random Number

Electrostatic Discharge (ESD) failure is an important reliability problem in the whole life cycle of integrated circuits. Due to the large number of pins in large scale integrated circuit, it is necessary to optimize the pin combination of ESD test to reduce the test time. In this paper, a pin combination optimization technique based on statistical method is proposed, and a low-parasitic HBM tester is used to realize two-pin testing to further reduce the number of power pin pair combinations. Taking multi-pin integrated circuits as the research object, the combination optimization method based on pseudo-random number sampling and twopin testing is studied and verified by experiments. The correctness of the proposed method is proved by comparing whether the ESD failure threshold voltage of the optimization method and the traditional method is close, and the test time comparison proves that the proposed method can further reduce the test time.