Research on Measurement Method for Secondary Electron Emission Coefficient of Aerospace Material

When charged particles incident on the material surface, they will excite secondary electrons and backscattered electrons from the material surface. For low conductivity dielectric materials, the emission of secondary electrons is one of the important mechanisms that cause the surface charging of the material. As the spacecraft surface contains materials with different secondary electron emission coefficients, there is a risk of electrostatic discharge between materials as a result of differential charging, so it is necessary to study the relationship between secondary electron emission and spacecraft surface charging. This paper introduces a measurement method of secondary electron emission coefficient of dielectric materials, using pulsed electron beam together with ultraviolet lamp to neutralize the charged surface during the measurement, and combines the results of secondary electron emission coefficient of typical aerospace materials (Gold, Aluminum, Single-sided Aluminum Plated Kapton™, Double-sided Aluminum Plated F46, Carburized Kapton™, and Polyester Film) to study the impact of secondary electron emission on the surface charging level of spacecraft, laying the foundation for carrying out spacecraft electrostatic protection.