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Research on fault diagnosis in analog circuit based on wavelet-neural network

  • Yuan Haiying*
  • , Chen Guangju
  • , Shi Sanbao
  • , Chen Huawei
  • *此作品的通讯作者
  • University of Electronic Science and Technology of China
  • Wuhan University of Technology
  • Southwest Jiaotong University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

The fault diagnosis method based on wavelet-neural network in analog circuit was presented. The problems on feature extraction in analog circuit, data pre-processing, training and testing of network, fault pattern classification were all discussed here. Fault features were extracted by circuit simulation, after data preprocessed by wavelet-neural network, which can be constructed into samples aggregation, the samples for training and testing were used to train and test neural network respectively, the uniform pattern samples were used to diagnose faults, the fault diagnosis in analogy circuit was realized effectively. An illustration validated this method.

源语言英语
主期刊名Proceedings of the World Congress on Intelligent Control and Automation (WCICA)
2659-2662
页数4
DOI
出版状态已出版 - 2006
已对外发布
活动6th World Congress on Intelligent Control and Automation, WCICA 2006 - Dalian, 中国
期限: 21 6月 200623 6月 2006

出版系列

姓名Proceedings of the World Congress on Intelligent Control and Automation (WCICA)
1

会议

会议6th World Congress on Intelligent Control and Automation, WCICA 2006
国家/地区中国
Dalian
时期21/06/0623/06/06

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