Research on failure mechanism of plastic encapsulated microcircuits

Jiao ying Huang; Wei Cui; Cheng Gao

doi:10.4156/AISS.vol4.issue20.61

Research on failure mechanism of plastic encapsulated microcircuits

Jiao ying Huang^*
, Wei Cui
, Cheng Gao

^*此作品的通讯作者

可靠性与系统工程学院

Beihang University

科研成果: 期刊稿件 › 文章 › 同行评审

2 引用（Scopus）

摘要

Plastic encapsulated microcircuit (PEM) had been invented in the 60s of the 20th century, with great advantages in size, weight, cost and performance. Nevertheless, there are still great differences between PEMs and high reliable devices and many problems cannot be ignored, such as corrosion, popcorn effect and low-temperature stratification. In this paper, common failure modes and their mechanisms of PEMs have been discussed according to some typical failure cases, which can provide an important basis for improving the process technology and enhancing the reliability of PEMs.

源语言	英语
页（从-至）	512-519
页数	8
期刊	Advances in Information Sciences and Service Sciences
卷	4
期	20
DOI	https://doi.org/10.4156/AISS.vol4.issue20.61
出版状态	已出版 - 11月 2012

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abstract = "Plastic encapsulated microcircuit (PEM) had been invented in the 60s of the 20th century, with great advantages in size, weight, cost and performance. Nevertheless, there are still great differences between PEMs and high reliable devices and many problems cannot be ignored, such as corrosion, popcorn effect and low-temperature stratification. In this paper, common failure modes and their mechanisms of PEMs have been discussed according to some typical failure cases, which can provide an important basis for improving the process technology and enhancing the reliability of PEMs.",

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AB - Plastic encapsulated microcircuit (PEM) had been invented in the 60s of the 20th century, with great advantages in size, weight, cost and performance. Nevertheless, there are still great differences between PEMs and high reliable devices and many problems cannot be ignored, such as corrosion, popcorn effect and low-temperature stratification. In this paper, common failure modes and their mechanisms of PEMs have been discussed according to some typical failure cases, which can provide an important basis for improving the process technology and enhancing the reliability of PEMs.

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KW - Failure mods

KW - PEM

KW - Reliability

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Research on failure mechanism of plastic encapsulated microcircuits

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