Research on diagnostics and prognostics of FPGA-based system

Cheng Gao; Wei Guo; Yue Sun

doi:10.1109/PHM.2012.6228798

Research on diagnostics and prognostics of FPGA-based system

Cheng Gao^*
, Wei Guo
, Yue Sun

^*此作品的通讯作者

可靠性与系统工程学院

Beihang University

科研成果: 会议稿件 › 论文 › 同行评审

摘要

FPGAs are widely adopted in many application domains and the higher accuracy requirement of FPGA makes the diagnostics and prognostics techniques of FPGA-based system is becoming increasingly important. This paper takes the stuck-at fault of look-up table in programmable logic blocks as a research object and presents the diagnostic method based on the Built-in Self Test. Example is provided for the approach and some basic physics of failure models are given to estimate the damage to the FPGA.

源语言	英语
DOI	https://doi.org/10.1109/PHM.2012.6228798
出版状态	已出版 - 2012
活动	2012 3rd Annual IEEE Prognostics and System Health Management Conference, PHM-2012 - Beijing, 中国期限: 23 5月 2012 → 25 5月 2012

会议

会议	2012 3rd Annual IEEE Prognostics and System Health Management Conference, PHM-2012
国家/地区	中国
市	Beijing
时期	23/05/12 → 25/05/12

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10.1109/PHM.2012.6228798

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链接到 Scopus 的出版物

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title = "Research on diagnostics and prognostics of FPGA-based system",

abstract = "FPGAs are widely adopted in many application domains and the higher accuracy requirement of FPGA makes the diagnostics and prognostics techniques of FPGA-based system is becoming increasingly important. This paper takes the stuck-at fault of look-up table in programmable logic blocks as a research object and presents the diagnostic method based on the Built-in Self Test. Example is provided for the approach and some basic physics of failure models are given to estimate the damage to the FPGA.",

keywords = "BIST, FPGA, fault models, physics of failure",

author = "Cheng Gao and Wei Guo and Yue Sun",

year = "2012",

doi = "10.1109/PHM.2012.6228798",

language = "英语",

note = "2012 3rd Annual IEEE Prognostics and System Health Management Conference, PHM-2012 ; Conference date: 23-05-2012 Through 25-05-2012",

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AU - Gao, Cheng

AU - Guo, Wei

AU - Sun, Yue

PY - 2012

Y1 - 2012

N2 - FPGAs are widely adopted in many application domains and the higher accuracy requirement of FPGA makes the diagnostics and prognostics techniques of FPGA-based system is becoming increasingly important. This paper takes the stuck-at fault of look-up table in programmable logic blocks as a research object and presents the diagnostic method based on the Built-in Self Test. Example is provided for the approach and some basic physics of failure models are given to estimate the damage to the FPGA.

AB - FPGAs are widely adopted in many application domains and the higher accuracy requirement of FPGA makes the diagnostics and prognostics techniques of FPGA-based system is becoming increasingly important. This paper takes the stuck-at fault of look-up table in programmable logic blocks as a research object and presents the diagnostic method based on the Built-in Self Test. Example is provided for the approach and some basic physics of failure models are given to estimate the damage to the FPGA.

KW - BIST

KW - FPGA

KW - fault models

KW - physics of failure

UR - https://www.scopus.com/pages/publications/84866144177

U2 - 10.1109/PHM.2012.6228798

DO - 10.1109/PHM.2012.6228798

M3 - 论文

AN - SCOPUS:84866144177

T2 - 2012 3rd Annual IEEE Prognostics and System Health Management Conference, PHM-2012

Y2 - 23 May 2012 through 25 May 2012

ER -

Research on diagnostics and prognostics of FPGA-based system

摘要

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