跳到主要导航 跳到搜索 跳到主要内容

Reliability Simulation Modeling Techniques under Multiple Degradation Mechanisms

  • Lan Wan
  • , Chuan Lv
  • , Weixuan Zhou
  • , Zhang Miao
  • , Yuxue Jin*
  • *此作品的通讯作者
  • Beihang University
  • China Academy of Electronics and Information Technology

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

This paper explores the issue of state modeling for equipment under multiple degradation modes, aiming to propose a comprehensive method for assessing equipment reliability. The natural degradation of equipment is not due to a single mode but results from the combined effects of various mechanisms such as fatigue, corrosion, wear, and crack propagation. This phenomenon of multiple degradation mechanisms renders a single degradation model insufficient to fully characterize the natural evolution of equipment. Therefore, this study introduces different characterization processes for different degradation modes, with the goal of developing an integrated state modeling method that considers multiple degradation modes to more accurately predict and assess the current mission reliability of the equipment. Finally, through a case study, the effectiveness of the proposed method in practical application is verified, and a detailed analysis of the modeling results is conducted.

源语言英语
主期刊名Proceedings - 2024 15th International Conference on Reliability, Maintenance and Safety, ICRMS 2024
出版商Institute of Electrical and Electronics Engineers Inc.
886-893
页数8
ISBN(电子版)9798331529116
DOI
出版状态已出版 - 2024
活动15th International Conference on Reliability, Maintenance and Safety, ICRMS 2024 - Gulin, 中国
期限: 31 7月 20242 8月 2024

出版系列

姓名Proceedings - 2024 15th International Conference on Reliability, Maintenance and Safety, ICRMS 2024

会议

会议15th International Conference on Reliability, Maintenance and Safety, ICRMS 2024
国家/地区中国
Gulin
时期31/07/242/08/24

学术指纹

探究 'Reliability Simulation Modeling Techniques under Multiple Degradation Mechanisms' 的科研主题。它们共同构成独一无二的学术指纹。

引用此