TY - GEN
T1 - Reliability estimation based on inverse Gaussian process supported by an ANN using two types of accelerated testing data
AU - Pang, Zeling
AU - Wang, Shaoping
AU - Duan, Xiaochuan
AU - Liu, Di
AU - Shang, Yaoxing
AU - Zhang, Yixin
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - Reliability analysis relies on data support, and artificial neural network (ANN) have clear advantages in data fitting. Therefore, ANN have been combined with inverse Gaussian process in reliability estimation. Existing reliability estimation methods based on inverse Gaussian process and ANN are only suitable for analyzing degradation test data under normal operating stress. However, to shorten the testing time, accelerated tests are widely conducted. In this study, on the basis of a generic logarithmic linear form of acceleration, the ANN-supported inverse Gaussian process is improved to a model for accelerated testing, and corresponding model training and experiment are conducted for accelerated stress relaxation degradation data and lifetime data. The experiment yielded individual degradation prediction results along with their corresponding error bands, as well as the reliability curve for the population. This confirms the effectiveness of the inverse Gaussian process-based reliability estimation method supported by ANN.
AB - Reliability analysis relies on data support, and artificial neural network (ANN) have clear advantages in data fitting. Therefore, ANN have been combined with inverse Gaussian process in reliability estimation. Existing reliability estimation methods based on inverse Gaussian process and ANN are only suitable for analyzing degradation test data under normal operating stress. However, to shorten the testing time, accelerated tests are widely conducted. In this study, on the basis of a generic logarithmic linear form of acceleration, the ANN-supported inverse Gaussian process is improved to a model for accelerated testing, and corresponding model training and experiment are conducted for accelerated stress relaxation degradation data and lifetime data. The experiment yielded individual degradation prediction results along with their corresponding error bands, as well as the reliability curve for the population. This confirms the effectiveness of the inverse Gaussian process-based reliability estimation method supported by ANN.
KW - accelerated testing
KW - artificial neural network
KW - inverse Gaussian process
KW - reliability estimation
UR - https://www.scopus.com/pages/publications/85205690853
U2 - 10.1109/ICIEA61579.2024.10665190
DO - 10.1109/ICIEA61579.2024.10665190
M3 - 会议稿件
AN - SCOPUS:85205690853
T3 - 2024 IEEE 19th Conference on Industrial Electronics and Applications, ICIEA 2024
BT - 2024 IEEE 19th Conference on Industrial Electronics and Applications, ICIEA 2024
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 19th IEEE Conference on Industrial Electronics and Applications, ICIEA 2024
Y2 - 5 August 2024 through 8 August 2024
ER -