@inproceedings{c533e98ceb804cdf8ccb2dd9fdb73442,
title = "Reliability Assessment of Extravehicular Electric Tool Switch Buttons via the Integration of K-Means++ and Uncertain Random Accelerated Degradation Algorithms",
abstract = "The switch button is a critical component for enabling the start-stop function of extravehicular electric tools on the space station, with its reliability directly impacting the success of extravehicular maintenance tasks. This paper investigates the performance degradation of the switch button under prolonged storage conditions through accelerated degradation tests and proposes a hybrid approach that combines the k-means ++ algorithm with an uncertain random accelerated degradation model (URADM) to assess the reliability of the switch button. Initially, the stable degradation phase of the switch button is identified using the k -means \textasciicircum{}++ algorithm. Subsequently, the URADM is utilized for modeling and simulating degradation trajectories. Comparative analysis between simulation results and actual data validates the effectiveness of this method. Ultimately, we obtained the reliability of the switch button under the actual storage temperature.",
keywords = "k-means++ algorithm, reliability, switch button, uncertain random accelerated degradation model",
author = "Beichen He and Xiaoyang Li and Rui Kang and Shouqing Huang and Zhaolin Zhang and Hao Wang and Jing Wang",
note = "Publisher Copyright: {\textcopyright} 2024 IEEE.; 15th International Conference on Reliability, Maintenance and Safety, ICRMS 2024 ; Conference date: 31-07-2024 Through 02-08-2024",
year = "2024",
doi = "10.1109/ICRMS63553.2024.00160",
language = "英语",
series = "Proceedings - 2024 15th International Conference on Reliability, Maintenance and Safety, ICRMS 2024",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1005--1010",
booktitle = "Proceedings - 2024 15th International Conference on Reliability, Maintenance and Safety, ICRMS 2024",
address = "美国",
}