Reliability Analysis of a Small Form-factor Pluggable+ Optical Transceiver

Data centers expanding in size and requiring higher bandwidth and reliability. The reliability of optical transceivers, which are fundamental components of data center optical networks, has not been fully researched. This paper provides a reliability analysis of Small Form-factor Pluggable+ (SFP+) optical transceivers. The failure modes are analyzed using the Risk Priority Number (RPN) method and threat analysis matrix. An optical power test platform and an accelerated test system for SFP+ optical transceiver are constructed. Based on the results of the failure mode analysis, an accelerated degradation test was conducted on the SFP+ optical transceiver. The degradation data are analyzed using the Wiener process. The reliability function and mean time to failure (MTTF) of the SFP+ optical transceivers are evaluated under the test conditions. The MTTF is 2215.04 hours. This research can provide some reference for reliability research of optical transceivers.