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Reliability Analysis for Dependent Competing Failure Processes Considering Various Maintenance Quality

  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

This paper proposed a reliability model based on Degradation-Threshold-Shock (DTS) model considering multiple dependent failure process including internal degradation process, external shock process and maintenance process. To model the maintenance process under condition-based maintenance strategy more properly, a M-Shock process is proposed, in which the maintenance timing is dependent on the real-Time condition of system and the quality of maintenance can be different with the degree of degradation regression and degradation rate change. A reliability function is finally proposed and a numerical example is also presented to illustrate the effectiveness of the model.

源语言英语
主期刊名Proceedings - 2018 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2018
编辑Chuan Li, Dian Wang, Diego Cabrera, Yong Zhou, Chunlin Zhang
出版商Institute of Electrical and Electronics Engineers Inc.
274-278
页数5
ISBN(电子版)9781538660577
DOI
出版状态已出版 - 2 7月 2018
活动2018 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2018 - Xi'an, 中国
期限: 15 8月 201817 8月 2018

出版系列

姓名Proceedings - 2018 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2018

会议

会议2018 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2018
国家/地区中国
Xi'an
时期15/08/1817/08/18

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